Gilson Wirth received the B.S.E.E and M.Sc. degrees from the Univ. Federal do Rio Grande do Sul, Brazil, in 1990 and 1994, respectively. In 1999 he received the Dr.-Ing. degree in Electrical Engineering from the University of Dortmund, Dortmund, Germany. He is currently a professor at the Electrical Eng. Dep. at the Univ. Federal do Rio Grande do Sul - UFRGS, where he was the head of graduate and undergraduate courses. He has stablished successful collaborative work with different companies and research groups in Europe, North and South America, and Asia. He is currently a Distinguished Lecturer of the IEEE Electron Devices Society. He was a Distinguished Lecturer of the IEEE Circuits and Systems Society (term 2010 to 2011).
His current research work focuses on modeling and electrical stimulation of charge trapping in the context of Bias Temperature Instability (BTI), Low-Frequency Noise (1/f and RTN) and Hot Carrier Injection (HCI).
He has also worked on ionizing radiation effects (TID and SET/SEU) on semiconductor devices.
CV may be found at http://lattes.cnpq.br/1745194055679908.
E-Mail: gilson dot wirth at ufrgs dot br
An updated list of publication may be found at http://lattes.cnpq.br/1745194055679908